Publications
Affichage de 14221 à 14230 sur 16106
2½ D microfabricated nib-like sources for nanoelectrospray applications
S. Le Gac, S. Arscott, C. Rolando
2003, pp.1211-1214. ⟨hal-00146442⟩
Influence on the step covering on fatigue phenomenon for polycrystalline silicon MEMS
O. Millet, Bernard Legrand, D. Collard, L. Buchaillot
Japanese Journal of Applied Physics, 2003, 41, pp.L1339-L1341. ⟨hal-00146435⟩
Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD)
L. Buchaillot
Microelectronics Reliability, 2003, 43, pp.1919-1928. ⟨hal-00146437⟩
Low-frequency drain noise in AlGaN/GaN HEMTs on Si substrate
N. Malbert, N. Labat, A. Curutchet, A. Touboul, Christophe Gaquière, A. Minko
2003, pp.342-349. ⟨hal-00162738⟩
Double-gate HEMTs on transferred substrate
Nicolas Wichmann, I. Duszynski, T. Parenty, S. Bollaert, J. Mateos, X. Wallart, A. Cappy
2003, pp.118-121. ⟨hal-00145995⟩
Noise modelling of 0.25 µm fully depleted SOI MOSFETs
G. Pailloncy, Gilles Dambrine, Francois Danneville, B. Iniguez, J.P. Raskin
2003, pp.577-580. ⟨hal-00145992⟩
MBE growth of AlGaN/GaN HEMTs on resistive Si (111) substrate with RF small signal and power performances
Y. Cordier, F. Semond, P. Lorenzini, N. Grandjean, F. Natali, B. Damilano, J. Massies, Virginie Hoel, A. Minko, N. Vellas, Christophe Gaquière, Jean-Claude de Jaeger, B. Dessertenne, S. Cassette, Et Al.
Journal of Crystal Growth, 2003, 251, pp.811-815. ⟨hal-00146661⟩
IEMN : a center of the french network for basic research in Micro@Nano technology
A. Cappy
Trends in NanoTechnology, TNT 2003, 2003, Salamanca, Spain. ⟨hal-00146046⟩
Etude physique du phénomène de claquage par avalanche dans les transistors à effet de champ
M. Elkhou, Michel Rousseau, Jean-Claude de Jaeger
2003, pp.2D-21. ⟨hal-00146663⟩
Novel design for semiconductor optical filters using apodised Bragg gratings
S. Garidel, Jean-Pierre Vilcot, Didier Decoster
NEFERTITI Workshop on Recent advances in all-optical processing of microwave and RF signals & Fiber radio systems, 2003, Valence, France. ⟨hal-00146554⟩