Publicaciones
Affichage de 6051 à 6060 sur 16084
Improved performance of flexible CMOS technology using ultimate thinning and transfer bonding
Emmanuel Dubois, Justine Philippe, Matthieu Berthomé, J.F. Robillard, Christophe Gaquière, Francois Danneville, Daniel Gloria, Christine Raynaud
6th Electronic System-Integration Technology Conference (ESTC), Sep 2016, Grenoble, France. ⟨10.1109/ESTC.2016.7764513⟩. ⟨hal-03272693⟩
Broadband dielectric characterization of aqueous saline solutions by an interferometer-based microwave microscope
S. Gu, Tianjun Lin, T. Lasri
Applied Physics Letters, 2016, 108 (24), pp.242903. ⟨10.1063/1.4953629⟩. ⟨hal-03538486⟩
Inverse saffman-taylor experiments with particles lead to capillarity driven fingering instabilities
Ilyesse Bihi, Michael Baudoin, Jason E. Butler, Christine Faille, Farzam Zoueshtiagh
Physical Review Letters, 2016, 117 (3), ⟨10.1103/PhysRevLett.117.034501⟩. ⟨hal-02636447⟩
METASTABILITY OF FINITE STATE MARKOV CHAINS: A RECURSIVE PROCEDURE TO IDENTIFY SLOW VARIABLES FOR MODEL REDUCTION
Claudio Landim, T. Xu
ALEA : Latin American Journal of Probability and Mathematical Statistics, 2016. ⟨hal-01728594⟩
DS-UWB and TH-UWB Energy Consumption Comparison
Adil Elabboubi, Fouzia Elbahhar, Marc Heddebaut, Yassin El Hillali
Journal of Telecommunications and Information Technology, 2016, 2016 (1), pp.101-109. ⟨hal-01469836v2⟩
Magnetic-Phase Dependence of the Spin Carrier Mean Free Path in Graphene Nanoribbons
Jing Li, Yann-Michel Niquet, Christophe Delerue
Physical Review Letters, 2016, 116 (23), pp.236602. ⟨10.1103/PhysRevLett.116.236602⟩. ⟨cea-01849844⟩
AlN/IDT/AlN/Sapphire SAW Heterostructure for High-Temperature Applications
Ouarda Legrani, Thierry Aubert, Omar Elmazria, Ausrine Bartasyte, Pascal Nicolay, Abdelkrim Talbi, Pascal Boulet, Jaafar Ghanbaja, Denis Mangin
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 2016, 63 (6), pp.898 - 906. ⟨10.1109/TUFFC.2016.2547188⟩. ⟨hal-01525494⟩
Reliability assessment of ultra-short gate length AlGaN/GaN HEMTs on Si substrate by on-state step stress
Hadhemi Lakhdar, Nathalie Labat, Arnaud Curutchet, N. Defrance, Marie Lesecq, J.C. Dejaeger, Nathalie Malbert
Microelectronics Reliability, 2016. ⟨hal-01718762⟩
Toward Energy Profiling of Connected Embedded Systems
Nadir Cherifi, Gilles Grimaud, Alexandre Boé, Thomas Vantroys
NTMS 2016 - 8th IFIP International Conference on New Technologies, Mobility and Security , Nov 2016, Larnaca, Cyprus. pp.1 - 4, ⟨10.1109/NTMS.2016.7792483⟩. ⟨hal-01599164⟩
Above 2000 V breakdown voltage at 600 K GaN-on-silicon high electron mobility transistors
Nicolas Herbecq, Isabelle Roch-Jeune, Astrid Linge, Malek Zegaoui, Pierre-Olivier Jeannin, Nicolas Clément, Jean-Paul Rouger, F Medjdoub
Physica Status Solidi A (applications and materials science), 2016, 213 (4), pp.873--877. ⟨10.1002/pssa.201532572⟩. ⟨hal-02277752⟩