Publicaciones

Affichage de 3311 à 3320 sur 16347


  • Communication dans un congrès

Model selection for support-vector machines through metaheuristic optimization algorithms

Oumeima Ghnimi, Sofiane Kharbech, Akram Belazi, Ammar Bouallegue

A machine learning algorithm aims at designing a mathematical model based on a given training data set. Generally, the built model has a set of parameters that need to be adjusted. Since the performance of a given model depends on its settings, the parameters have to be carefully chosen through a...

Thirteenth International Conference on Machine Vision, ICMV 2020, Session 6 - Artificial Intelligence and Intelligent Computing, SPIE, Nov 2020, Rome, Italy. pp.1160509, 59, ⟨10.1117/12.2587439⟩. ⟨hal-03449833⟩

  • Article dans une revue

SERS characterization of aggregated and isolated bacteria deposited on silver-based substrates

Cristina-Cassiana Andrei, Anne Moraillon, Eric Larquet, Monica Potara, Simion Astilean, Endre Jakab, Julie Bouckaert, Léa Rosselle, Nadia Skandrani, Rabah Boukherroub, Francois Ozanam, Sabine Szunerits, Anne Chantal Gouget-Laemmel

Surface-enhanced Raman scattering (SERS), based on the enhancement of the Raman signal of molecules positioned within a few nanometres from a structured metal surface, is ideally suited to provide bacterial-specific molecular fingerprints which can be used for analytical purposes. However, for some...

Analytical and Bioanalytical Chemistry, 2021, 413, pp.1417-1428. ⟨10.1007/s00216-020-03106-5⟩. ⟨hal-03044073⟩

  • Article dans une revue

Mm-wave through-load element for on-wafer measurement applications

Marc Margalef-Rovira, Olivier Occello, Abdelhalim Saadi, Vanessa Avramovic, Sylvie Lepilliet, Loïc Vincent, Manuel J. Barragan, Emmanuel Pistono, Sylvain Bourdel, Christophe Gaquière, Philippe Ferrari

This paper presents an innovative Through-Load element aimed at characterization applications at mm-wave frequencies. The proposed structure can behave as a Through connection or as a 50-Ω load depending on a DC control voltage. Among other potential applications, this system can be used to...

IEEE Transactions on Circuits and Systems I: Regular Papers, 2021, 68 (8), pp.3170-3183. ⟨10.1109/TCSI.2021.3072097⟩. ⟨hal-03202213⟩

  • Article dans une revue

Piezoresistance in defect-engineered silicon

Heng Li, Abel Thayil, Chris Lew, Marcel Filoche, Brett Johnson, Jeff Mccallum, S. Arscott, Alistair C. H. Rowe

The steady-state, space-charge-limited piezoresistance (PZR) of defect-engineered, silicon-on-insulator device layers containing silicon divacancy defects changes sign as a function of applied bias. Above a punch-through voltage (Vt) corresponding to the onset of a space-charge-limited hole current...

Physical Review Applied, 2021, 15 (1), 014046, 9 p. ⟨10.1103/PhysRevApplied.15.014046⟩. ⟨hal-03003310⟩

  • Autre publication scientifique

Advances in Historical Studies [Editor in Chief 10/3]

Raffaele Pisano

2021. ⟨hal-04510951⟩