Publicaciones
Affichage de 15861 à 15870 sur 16279
EAO des circuits microondes en régime temporel : approche physique
Christophe Dalle, M.R. Friscourt
11èmes Journées Nationales Microondes, 1999, Arcachon, France. ⟨hal-00005311⟩
Terahertz time-domain spectroscopy of films fabricated from SU-8
S. Arscott, F. Garet, P. Mounaix, L. Duvillaret, J.-L. Coutaz, D. Lippens
Electronics Letters, 1999, 35 (3), pp.243. ⟨10.1049/el:19990146⟩. ⟨hal-02348056⟩
High-frequency four noise parameters of silicon-on-insulator-based technology MOSFET for the design of low-noise RF integrated circuits
Gilles Dambrine, J.-P. Raskin, Francois Danneville, D. Vanhoenackel Janvier, J.-P. Colinge, A. Cappy
IEEE Transactions on Electron Devices, 1999, 46 (8), pp.1733-1741. ⟨10.1109/16.777164⟩. ⟨hal-03612809⟩
Large signal and pulse instabilities in GaN HFETs
Erhard Kohn, E Strobel, I. Daumiller, Christophe Gaquière, B. Boudart, Didier Theron, N.X. Nguyen, C.N. Nguyen
1st Gallium Nitride Electronic Device Workshop, 1999, Cornell, United States. ⟨hal-01654323⟩
Transferred InP-based HBVs on glass substrate
S. Arscott, P. Mounaix, D. Lippens
Electronics Letters, 1999, 35 (17), pp.1493. ⟨10.1049/el:19990984⟩. ⟨hal-02348069⟩
Electromagnetic waves in finite superlattices with buffer and cap layers
M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski, M. Hammouchi, E. El Boudouti, A. Nougaoui
Journal of the Optical Society of America. A Optics, Image Science, and Vision, 1999, 16 (7), pp.1703. ⟨10.1364/JOSAA.16.001703⟩. ⟨hal-04070498⟩
Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy
Emmanuel Dubois, Jean-Luc Bubbendorff
Solid-State Electronics, 1999, 43 (6), pp.1085-1089. ⟨10.1016/S0038-1101(99)00029-5⟩. ⟨hal-04246744⟩
Développement d’une attaque chimique sélective entre GaAs et Al0.22Ga0.78As et application au creusement du fossé de grille d’un TEC de puissance
X. Hue, B. Boudart, Y. Crosnier
7es Journées Nationales Microélectronique et Optoélectronique (JNMO), 1999, Egat, France. ⟨hal-01654470⟩
Influence of the Source Inductance Parasitic Effect on the Conversion Gain of the HEMT Gate Mixer
Rachid Allam, Christophe Kolanowski, Jean-Marie Paillot, Claude Duvanaud, Y. Crosnier
Microwave and Optical Technology Letters, 1999, 22 (3), pp.149--151. ⟨10.1002/(SICI)1098-2760(19990805)22:33.0.CO;2-K⟩. ⟨hal-03360876⟩
Trap effects studies in GaN MESFETs by pulsed measurements
S. Trassaert, B. Boudart, Christophe Gaquière, Didier Theron, Y. Crosnier, F. Huet, M.A. Poisson
Electronics Letters, 1999, 35 (16), ⟨10.1049/el:19990887⟩. ⟨hal-01647642⟩