Publicaciones

• Communication dans un congrès

Automatic biasing point extraction and design plan generation for analog IPs

R. Iskander, A. Kaiser, M.M. Louerat

2005, pp.907-910. ⟨hal-00138402⟩

• Autre publication scientifique

Caractérisation et stimulation de la susceptibilité des circuits intégrés face aux risques d'induction engendrés par des micro-ondes de fortes puissances

S. Bazzoli

2005. ⟨hal-00140410⟩

• Communication dans un congrès

Influence of the PCB traces of an automotive electronic equipment in the case of random cable harnesses

S. Egot, M. Klingler, L. Kone, S. Baranowski, B. Demoulin

2005, pp.125-130. ⟨hal-00140411⟩

• Communication dans un congrès

Reduction of the cross coupling in acoustical arrays

Sébastien Grondel, C. Granger, P. Poussot, Anne-Christine Hladky, Jamal Assaad

Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, 2005, Beijing, China. ⟨hal-00140415⟩

• Communication dans un congrès

Effet de la variabilité des faisceaux de câbles entrelacés sur la précision requise sur les modèles d'équipements électroniques automobiles

S. Egot, M. Klingler, L. Kone, S. Baranowski, B. Demoulin

GDR Ondes, Journée 'Gestion de l'incertitude et analyse de sensibilité aux paramètres', 2005, Paris, France. ⟨hal-00140423⟩

• Communication dans un congrès

Use of MIMO techniques for decreasing the output transmitting power of wireless systems

M. Lienard, Pierre Degauque

EMC Europe Workshop on Electromagnetic Compatibility of Wireless Systems, 2005, Roma, Italy. ⟨hal-00140426⟩

• Communication dans un congrès

Design of an ultrasonic system for the online detection of foreign bodies embedded in viscoelastic media

Georges Nassar, Wei-Jiang Xu, Bertrand Nongaillard, Liévin Camus

Proceedings of the 2005 Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, 2005, Beijing, China. ⟨hal-00140798⟩

• Communication dans un congrès

High Accuracy 65nm OPC Verification: Full Process Window Model vs. Critical Failure ORC

Amandine Borjon, Jerome Belledent, Shumay D. Shang, Olivier Toublan, Corinne Miramond, Kyle Patterson, Kevin Lucas, Christophe Couderc, Yves Rody, Frank Sundermann, Jean-Christophe Urbani, Stanislas Baron, Yorick Trouiller, Patrick Schiavone

It is becoming more and more difficult to ensure robust patterning after OPC due to the continuous reduction of layout dimensions and diminishing process windows associated with each successive lithographic generation. Lithographers must guarantee high imaging fidelity throughout the entire range...

2005, pp.1750-1761. ⟨hal-00023223⟩

• Article dans une revue

Ultrasonic cavitation in thin liquid layers

A. Moussatov, C. Granger, Bertrand Dubus

Ultrasonics Sonochemistry, 2005, 12, pp.415-422. ⟨hal-00124472⟩

• Communication dans un congrès

Inelastic electron tunnelling in metal/alkylsilane/silicon juntions

C. Petit, G. Salace, S. Lenfant, D. Vuillaume

8th European Conference on Molecular Electronics, ECME8, 2005, Bologna, Italy. ⟨hal-00125598⟩