Publicaciones
Affichage de 13091 à 13100 sur 16095
Empirical MOSFET modelling for RF circuit design
A. Siligaris, Gilles Dambrine, F. Sischka, Francois Danneville
2005, 4 pp. ⟨hal-00147493⟩
Perfluorinated graded index polymer optical fiber used for the enhancement of the in-buildings coverage of radiocellular signals
C. Lethien, A. Goffin, Jean-Pierre Vilcot, Christophe Loyez
Proceedings of the 14th International Conference on Plastic Optical Fiber, 2005, Hong Kong, China. ⟨hal-00131126⟩
Field model for V(z) evaluation ant its application in material characterization
Wei-Jiang Xu, Mohamed Ourak
Proceedings of the 2005 Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, 2005, Beijing, China. ⟨hal-00140794⟩
Combined master and Fokker–Planck equations for the modeling of the kinetics of extended defects in Si
E. Lampin, C.J. Ortiz, N.E.B. Cowerne, B. Colombeau, Fuccio Cristiano
Solid-State Electronics, 2005, 49, pp.1168-1171. ⟨hal-00138394⟩
Generation of second harmonics by phase conjugate ultrasound wave in a medium with nonlinear inclusion
S. Preobrazhensky, Vladimir Preobrazhensky, Philippe Pernod
Physics of Wave Phenomena, 2005, 13, pp.24-29. ⟨hal-00138391⟩
Picosecond ultrasonics : an original tool for physical characterization of Bragg reflectors in Bulk Acoustic Wave resonators
P. Emery, Arnaud Devos, G. Caruyer, R. Velard, N. Casanova, P. Ancey
2005, pp.906-909. ⟨hal-00124480⟩
Design and characterisation of 1-3 ultrasonic composites using ATILA and ultra-fast laser measurements (20 MHz)
T. Rodig, A. Schonecker, Anne-Christine Hladky
2005, pp.353-356. ⟨hal-00124479⟩
Acoustic resonance and magneto-elasticity in weak magnetic fields
V.N. Berzhansky, Philippe Pernod, S.N. Polulyakh, V.L. Preobrazhensky, M.B. Strugatsky, S.V. Yagupov
Proceedings of the 2005 International Conference on Functional Materials, ICFM'2005, 2005, Crimea, Ukraine. ⟨hal-00138853⟩
Electronic properties of molecular nanostructures
D. Vuillaume
Nanotech 2005, Japan-France Workshop on Nanosciences and Nanotechnologies, 2005, Tokyo, Japan. ⟨hal-00125615⟩
MEMS reliability : metrology set-up for investigation of fatigue causes
O. Millet, O. Blanrue, Bernard Legrand, D. Collard, L. Buchaillot
2005, pp.483-486. ⟨hal-00125627⟩