Publicaciones
Affichage de 12791 à 12800 sur 16095
Ultra-low voltage MEMS resonator based on RSG-MOSFET
N. Abele, K. Segueni, K. Boucart, F. Casset, Bernard Legrand, L. Buchaillot, P. Ancey, A.M. Ionescu
2006, pp.882-885. ⟨hal-00128669⟩
Parallel-plate electrostatic actuators in liquids : displacement-voltage optimisation for microfluidic applications
Bernard Legrand, A.S. Rollier, L. Buchaillot, D. Collard
2006, pp.718-721. ⟨hal-00128668⟩
Self-assembling carbon nanotubes for electronics
J.P. Bourgoin, S. Auvray, J. Borghetti, Vincent Derycke, M.F. Goffman, P. Chenevier, L. Goux-Capes, A. Filoramo, R. Lefevre, S. Straif, K. Nguyen, S. Lyonnais, Et Al., D. Vuillaume
Trends in Nanotechnology Conference, TNT2006, 2006, Grenoble, France. ⟨hal-00138912⟩
Damaging process determination
L. Buchaillot, O. Millet
Symposium on Mechanical Reliability of Silicon MEMS – Recent progress and further requirements, 2006, Halle Saale, Germany. ⟨hal-00128690⟩
Design of a distributed oscillator in 130 nm SOI MOS technology
M. Si Moussa, C. Pavageau, L. Picheta, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier
2006, 4 pp. ⟨hal-00147510⟩
A fully InP monolithic integrated millimeter-wave reflectometer
Kamel Haddadi, H. El Aabbaoui, B. Gorisse, D. Glay, N. Rolland, T. Lasri
2006, pp.703-706. ⟨hal-00147515⟩
Mechanical properties measured by nanoindentation of Pb(Zr,Ti)O3 sol-gel films deposited on Pt and LaNiO3 electrodes
P. Delobelle, G.S. Wang, E. Fribourg-Blanc, Denis Remiens
Surface and Coatings Technology, 2006, 201, pp.3155-3162. ⟨hal-00138714⟩
Interfaces between gamma-Al2O3 and silicon
Pierre Boulenc, Isabelle Devos
Materials Science in Semiconductor Processing, 2006, 9 (6), pp.949-953. ⟨10.1016/j.mssp.2006.10.043⟩. ⟨hal-00152970⟩
Emission and immunity tests in anechoic chamber
B. Demoulin
Ben Dhia S., Ramdani M., Sicard E. Electromagnetic compatibility of integrated circuits circuits - Techniques for low emission and susceptibility, Springer US, pp.167-177, 2006. ⟨hal-00140360⟩
Fabrication and analysis of CMOS fully-compatible high conductance impact-ionization MOS (I-MOS) transistors
C. Charbuillet, Emmanuel Dubois, S. Monfray, P. Bouillon, T. Skotnicki
2006, pp.299-302. ⟨hal-00138680⟩