Publicaciones
Affichage de 10451 à 10460 sur 16094
Deep level investigation by capacitance and conductance transient spectroscopy in AlGaN/GaN/SiC HEMTs
M. Gassoumi, B. Grimbert, M.A. Poisson, Julien Fontaine, M.A. Zaidi, Christophe Gaquière, H. Maaref
Journal of Optoelectronics and Advanced Materials, 2009, 11, pp.1713-1717. ⟨hal-00473671⟩
Extension of the "equivalent cable bundle method" for modeling electromagnetic emissions of complex cable bundles
Guillaume Andrieu, Alain Reineix, X. Bunlon, J.P. Parmantier, L. Kone, B. Demoulin
IEEE Transactions on Electromagnetic Compatibility, 2009, 51, pp.108-118. ⟨10.1109/TEMC.2008.2007803⟩. ⟨hal-00473686⟩
Electron transport properties of gallium nitride for microscopic power device modelling
Brahim Benbakhti, Michel Rousseau, Ali Soltani, Jean-Claude de Jaeger
Journal of Physics: Conference Series, 2009, 193, pp.012005-1-4. ⟨10.1088/1742-6596/193/1/012005⟩. ⟨hal-00473639⟩
12 GHz F-max GaN/AlN/AlGaN nanowire MISFET
S. Vandenbrouck, K. Madjour, D. Theron, Y.J. Dong, Y. Li, C.M. Lieber, Christophe Gaquière
IEEE Electron Device Letters, 2009, 30, pp.322-324. ⟨10.1109/LED.2009.2014791⟩. ⟨hal-00473429⟩
Three-dimensional Monte Carlo study of three-terminal junctions based on InGaAs/InAlAs heterostructures
T. Sadi, F. Dessenne, Jean-Luc Thobel
Journal of Applied Physics, 2009, 105 (5), pp.0537075. ⟨10.1063/1.3087703⟩. ⟨hal-00473651⟩
Defect modes in one-dimensional anisotropic photonic crystal
Noama Ouchani, Driss Bria, Bahram Djafari-Rouhani, Abdlekarim Nougaoui
Journal of Applied Physics, 2009, 106 (11), pp.113107. ⟨10.1063/1.3266005⟩. ⟨hal-00473077⟩
Electrons in quantum dots : one by one
S. Gustavsson, R. Leturcq, T. Ihn, K. Ensslin, A.C. Gossard
Journal of Applied Physics, 2009, 105 (12), pp.122401. ⟨10.1063/1.3116227⟩. ⟨hal-00473401⟩
Quantum confinement effect on the effective mass in two-dimensional electron gas of AlGaN/GaN heterostructures
A.M. Kurakin, S.A. Vitusevich, S.V. Danylyuk, H. Hardtdegen, N. Klein, Z. Bougrioua, A.V. Naumov, A.E. Belyaev
Journal of Applied Physics, 2009, 105, pp.073703-1-6. ⟨10.1063/1.3100206⟩. ⟨hal-00472679⟩
A simple method for measuring Si-Fin sidewall roughness by AFM
X.H. Tang, V. Bayot, N. Reckinger, D. Flandre, J.P. Raskin, Emmanuel Dubois, B. Nysten
IEEE Transactions on Nanotechnology, 2009, 8, pp.611-616. ⟨10.1109/TNANO.2009.2021064⟩. ⟨hal-00471972⟩
Experimental and numerical study of miscible Faraday instability
Farzam Zoueshtiagh, S. Amiroudine, R. Narayanan
Journal of Fluid Mechanics, 2009, 628, pp.43-55. ⟨10.1017/S0022112009006156⟩. ⟨hal-00469657⟩