Publications
Affichage de 15481 à 15490 sur 16278
Etude expérimentale de l'inversion thermique en radiométrie micro-onde par corrélation : applications médicales
S. Bri, L. Bellarbi, M. Elkadiri, L. Zenkour, M. Habibi, A. Mamouni
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158164⟩
Towards terahertz circuits via InP micromachining techniques
S. Arscott, T. David, X. Melique, P. Mounaix, D. Lippens
2000, pp.561-564. ⟨hal-00158203⟩
Alloys effects in skutterudites compounds : theoretical calculations and experimental validations for CoSb3 and Fe0.5Ni0.5Sb3
M. Lassalle, I. Lefebvre-Devos, X. Wallart, J. Olivier-Fourcade, L. Monconduit
2000, pp.B-4. ⟨hal-00158949⟩
Systèmes moléculaires organisés, application aux nano-composants électroniques
Laurent Breuil, Dominique Vuillaume
7èmes Journées de la Matière Condensée, Aug 2000, Poitiers, France. ⟨hal-00158946⟩
Conical radiating waves in immersed wedges
Anne-Christine Hladky, P. Langlet, M. de Billy
Journal of the Acoustical Society of America, 2000, 108, pp.3079-3083. ⟨hal-00157821⟩
Evidence of polariton stimulation in semiconductor microcavities
F. Boeuf, R. Andre, R. Romestain, S.L. Dang, Emmanuel Peronne, Jean-Francois Lampin, D. Hulin, Antigoni Alexandrou
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 62 (4), pp.R2279(R). ⟨hal-00158233⟩
Etude de films organiques conducteurs monomoléculaires réalises par auto-assemblage
S. Lenfant, D. Vuillaume
GDR Films Moléculaires Bidimensionnels, 2000, Obernai, France. ⟨hal-00158945⟩
Theory of scanning tunneling microscopy of defects on semiconductors surfaces
X. de La Broïse, C. Delerue, M. Lannoo, B. Grandidier, D. Stievenard
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 61, pp.2138-2145. ⟨hal-00158951⟩
A study of the formation of nano-domains in mixed alkylsiloxane self-assembled monolayers on silicon
Laurent Breuil, Dominique Vuillaume
Proceedings of the 9th International Conference on Organized Molecular Films, LB9, Aug 2000, Potsdam, Germany. ⟨hal-00158958⟩
Comparison between TiAl and TiAlNiAu ohmic contacts to n-type GaN
B. Boudart, S. Trassaert, X. Wallart, J.C. Pesant, O. Yaradou, D. Theron, Y. Crosnier, H. Lahreche, F. Omnes
Journal of Electronic Materials, 2000, 29, pp.603-606. ⟨hal-00158984⟩